航天測控基于VXI總線的多功能邊界掃描控制器
趙文彥，杜 影，徐凌輝
（北京航天測控技術(shù)開發(fā)公司，北京 100037） 摘要：根據(jù)系統(tǒng)級邊界掃描測試技術(shù)的應用需求，基于VXI總線的多功能邊界掃描測試控制器具備三種操作模式：IEEE1149.1 TAP模式、IEEE1149.5主控制器模式和從控制器模式。由上位機控制模件組態(tài)到期望的模式，模件上的TAP口控制器產(chǎn)生1149.1測試信號，提供給JTAG口用于通過TDO/TDI掃描鏈對被測目標板進行邊界掃描測試。IEEE1149.5主控制器可完成和從控制器間的通訊以便對機箱或子系統(tǒng)級中可測試性模件進行邊界掃描測試。兼容于BSDL和EDIF文件格式的自動測試向量生成軟件可實現(xiàn)多種掃描測試功能。
關(guān)鍵詞：邊界掃描測試；MTM總線；TAP口；測試向量生成；
Multifunction Boundary Scan Controller Based on VXI_BUS
              Zhao wenyan, Du ying, Xu linghui
      (Beijing Aerospace Measurement & Control Corp, Beijing  100037 China)
Abstract: According to the requirement of Boundary Scan Test technique in systems, the multifunction boundary scan controller based on VXI bus is designed which has three kind of operators: TAP controller based on IEEE Std 1149.1, MTM-bus master controller and MTM-bus slave controller based on IEEE Std 1149.5. The host selects the operator schema , the TAP controller generates the 1149.1 test signals applied to test chains on a board through JTAG port. The master controller can be used to communicate with the slave controller implementing boundary scan test of testable subsystems. The automatic testing software which is compatible with BSDL files and EDIF files can complete multiple boundary scan test tasks.
  Key words: boundary scan test; MTM-Bus; TAP port ; test vector generation
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